SOPHISTICATED ANALYTICAL INSTRUMENT FACILITY (SAIF)

The Sophisticated Analytical Instrument Facility (SAIF) is a facility created at MUJ to host a range of sophisticated instruments to provide comprehensive insights into the physical properties and composition of materials. Moreover, these instruments are of inter/multidisciplinary utility and hence are put under one roof at a central facility so that they can be shared by the different R&D groups of the university for their optimum utilization. With the high level of expertise available at MUJ, the excellent analytical services of the facility are also offered on a chargeable basis to other Universities, Academic Institutions, and Commercial Organisations.

Field Emission Scanning Electron Microscope (FESEM) facility

FESEM is the latest addition to the SAIF at Manipal University Jaipur. The JEOL make JSM-7610FPlus FESEM at SAIF is an ultra-high-resolution electron microscope which has semi-in-lens detectors and an in-the-lens Schottky field emission gun. The instrument can deliver high resolution with wide range of probe currents which facilitates observation of extremely fine structures for all kind of samples including the biological samples. The JSM-7610F chamber is fitted with EDAX Energy Dispersive X-ray (EDS) detector for elemental analysis at the micro-nanoscale. Thus the machine is suitable for almost all kind of applications viz. nanotechnology, material science, biology, compositional and structural analysis.

Instrument Images

Salient Features

• High spatial resolution (1 kV 1.0 nm, 15 kV 0.8 nm)
• High probe current for analytical purposes like EDS
• High power optics to ensure small probe diameter even with large probe current
• Gentle Beam mode to reduce the landing voltage of the electrons suitable for top-surface imaging, reduced beam damage and charge suppression
• Energy filtered imaging to freely select between secondary electrons and backscattered electrons
• Eucentric specimen stage to rotate, tilt and shift the specimen with minimal focus deviation

FESEM Sample Preparation

The facility has the following instruments to process and prepare various samples for FESEM characterisation

• Compact and automatic rotary pumped sputter coater for gold/platinum/carbon coating of the non- conducting samples.
• Buehler IsoMet low speed precision sample cutter for cutting various types of materials including brittle or ductile metals, composites, cements, laminates, plastics, electronic devices and biomaterials with minimal deformation
• Buehler EcoMet 30 grinder and polisher for processing advanced materials e.g., metals, glass, ceramics, polymers, rubbers and composites

FESEM User form (for internal user)

X-ray Diffraction (XRD) Facility

The Rigaku make automated multipurpose X-ray Diffractometer (model: SMARTLAB) has the provision for advance material research on powders, thin films, and bulk solids of polycrystalline, nano-crystalline and amorphous nature.

Instrument Images

The XRD system must has the capability to configure in different modes like

• High resolution powder, polycrystalline, thin film X-Ray Diffraction
• Grazing Incidence X-Ray Diffraction (GIXRD)
• In-plane Diffraction with a horizontal sample mounting
• Residual Stress and Texture (Pole figure)
• Non-ambient analysis for phase transition study
• X-ray reflectometry (XRR), Rocking curve
• Small-angle X-ray scattering (SAXS)

XRD User Form (Internal User)

Confocal Raman Spectrometer

The Horiba make LabRAM HR Evolution Raman Spectrometer is a fully Motorized Micro Raman Czerny-Turner type achromatic spectrograph, equipped with a research-grade microscope capable of producing Raman (wavenumber transfer 50 to 4000 cm-1) and PL (330 nm to 1.7 microns). Raman Analysis, PL measurements, and Confocal mapping- can be done with the instrument. The system is useful for BioScience, Pharmaceuticals, and Semiconductor samples

Instrument Images

Salient Features

• Unequalled spectral resolution with 800 mm focal length Fully achromatic system 200-2200 nm from sample to detector Spectra Repeatability: 0.1 cm-1
• Spectral Scanning Linearity: < ± 0.5 cm-1
• Lasers: 325nm He-Cd Laser (25 mW)
• 532nm Nd:YAG (100 mW)
• 785nm laser diode (100 mW)
• Polarisation-dependent Raman measurements (400-1100 nm)
• Variable Temperature Measurement (–196°C to 600°C)

SAIF Occupancy Calendar

Click Here for checking the instrument occupancies.

Contact Details